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Journal: Coatings, 2020
Volume: 10
Number: 1146

Article: Electrical Characteristics and Stability Improvement of Top-Gate In-Ga-Zn-O Thin-Film Transistors with Al2O3/TEOS Oxide Gate Dielectrics
Authors: by Yih-Shing Lee, Yu-Hsin Wang, Tsung-Cheng Tien, Tsung-Eong Hsieh and Chun-Hung Lai
Link: https://www.mdpi.com/2079-6412/10/12/1146

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