Thickness-Dependent Differential Reflectance Spectra of Monolayer and Few-Layer MoS2, MoSe2, WS2 and WSe2

National Center for International Research on Green Optoelectronics & Guangdong Provincial Key Laboratory of Optical Information Materials and Technology, Institute of Electronic Paper Displays, South China Academy of Advanced Optoelectronics, South China Normal University, Guangzhou 510006, China

Instituto Madrileño de Estudios Avanzados en Nanociencia (IMDEA Nanociencia), Campus de Cantoblanco, E-28049 Madrid, Spain

National Key Laboratory of Science and Technology on Advanced Composites in Special Environments, Harbin Institute of Technology, Harbin 150001, China

⁴

Materials Science Factory, Instituto de Ciencia de Materiales de Madrid (ICMM), Consejo Superior de Investigaciones Científicas (CSIC), Sor Juana Inés de la Cruz 3, 28049 Madrid, Spain

⁵

Institute of Solid-state Theory, University of Münster, 48149 Münster, Germany

⁶

Institute of Physics and Center for Nanotechnology, University of Münster, 48149 Münster, Germany

⁷

Faculty of Physics, Khaje Nasir Toosi University of Technology (KNTU), Tehrān 19697 64499, Iran

⁸

Institute of Photonics, Vienna University of Technology, Gusshausstrasse 27–29, 1040 Vienna, Austria

Author to whom correspondence should be addressed.

Nanomaterials 2018, 8(9), 725; https://doi.org/10.3390/nano8090725

Received: 13 August 2018 / Revised: 2 September 2018 / Accepted: 7 September 2018 / Published: 14 September 2018

(This article belongs to the Special Issue Low Dimensional Materials for Environmental and Biomedical Applications)

View Full-Text Download PDF

Browse Figures

Citation Export

Abstract

The research field of two dimensional (2D) materials strongly relies on optical microscopy characterization tools to identify atomically thin materials and to determine their number of layers. Moreover, optical microscopy-based techniques opened the door to study the optical properties of these nanomaterials. We presented a comprehensive study of the differential reflectance spectra of 2D semiconducting transition metal dichalcogenides (TMDCs), MoS₂, MoSe₂, WS₂, and WSe₂, with thickness ranging from one layer up to six layers. We analyzed the thickness-dependent energy of the different excitonic features, indicating the change in the band structure of the different TMDC materials with the number of layers. Our work provided a route to employ differential reflectance spectroscopy for determining the number of layers of MoS₂, MoSe₂, WS₂, and WSe₂. View Full-Text

Keywords: 2D materials; transition metal dichalcogenides (TMDCs); MoS₂; MoSe₂; WS₂; WSe₂; optical properties; differential reflectance

▼ Show Figures

Figure 1

This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited

Supplementary Material

Supplementary File 1:
PDF-Document (PDF, 5632 KiB)

Share and Cite

MDPI and ACS Style

Niu, Y.; Gonzalez-Abad, S.; Frisenda, R.; Marauhn, P.; Drüppel, M.; Gant, P.; Schmidt, R.; Taghavi, N.S.; Barcons, D.; Molina-Mendoza, A.J.; De Vasconcellos, S.M.; Bratschitsch, R.; Perez De Lara, D.; Rohlfing, M.; Castellanos-Gomez, A. Thickness-Dependent Differential Reflectance Spectra of Monolayer and Few-Layer MoS₂, MoSe₂, WS₂ and WSe₂. Nanomaterials 2018, 8, 725. https://doi.org/10.3390/nano8090725

AMA Style

Niu Y, Gonzalez-Abad S, Frisenda R, Marauhn P, Drüppel M, Gant P, Schmidt R, Taghavi NS, Barcons D, Molina-Mendoza AJ, De Vasconcellos SM, Bratschitsch R, Perez De Lara D, Rohlfing M, Castellanos-Gomez A. Thickness-Dependent Differential Reflectance Spectra of Monolayer and Few-Layer MoS₂, MoSe₂, WS₂ and WSe₂. Nanomaterials. 2018; 8(9):725. https://doi.org/10.3390/nano8090725

Chicago/Turabian Style

Niu, Yue, Sergio Gonzalez-Abad, Riccardo Frisenda, Philipp Marauhn, Matthias Drüppel, Patricia Gant, Robert Schmidt, Najme S. Taghavi, David Barcons, Aday J. Molina-Mendoza, Steffen M. De Vasconcellos, Rudolf Bratschitsch, David Perez De Lara, Michael Rohlfing, and Andres Castellanos-Gomez. 2018. "Thickness-Dependent Differential Reflectance Spectra of Monolayer and Few-Layer MoS₂, MoSe₂, WS₂ and WSe₂" Nanomaterials 8, no. 9: 725. https://doi.org/10.3390/nano8090725

Find Other Styles

Note that from the first issue of 2016, MDPI journals use article numbers instead of page numbers. See further details here.

Article Metrics

Abstract views Pdf views Html views

Article Menu

Thickness-Dependent Differential Reflectance Spectra of Monolayer and Few-Layer MoS₂, MoSe₂, WS₂ and WSe₂

Abstract

Supplementary Material

Share and Cite

Article Metrics

Article Access Statistics

Article Access Map by Country/Region

Further Information

Guidelines

MDPI Initiatives

Follow MDPI