Niu, Y.;                     Gonzalez-Abad, S.;                     Frisenda, R.;                     Marauhn, P.;                     Drüppel, M.;                     Gant, P.;                     Schmidt, R.;                     Taghavi, N.S.;                     Barcons, D.;                     Molina-Mendoza, A.J.;     
    et al.    Thickness-Dependent Differential Reflectance Spectra of Monolayer and Few-Layer MoS2, MoSe2, WS2 and WSe2. Nanomaterials 2018, 8, 725.
    https://doi.org/10.3390/nano8090725
    AMA Style
    
                                Niu Y,                                 Gonzalez-Abad S,                                 Frisenda R,                                 Marauhn P,                                 Drüppel M,                                 Gant P,                                 Schmidt R,                                 Taghavi NS,                                 Barcons D,                                 Molina-Mendoza AJ,         
        et al.        Thickness-Dependent Differential Reflectance Spectra of Monolayer and Few-Layer MoS2, MoSe2, WS2 and WSe2. Nanomaterials. 2018; 8(9):725.
        https://doi.org/10.3390/nano8090725
    
    Chicago/Turabian Style
    
                                Niu, Yue,                                 Sergio Gonzalez-Abad,                                 Riccardo Frisenda,                                 Philipp Marauhn,                                 Matthias Drüppel,                                 Patricia Gant,                                 Robert Schmidt,                                 Najme S. Taghavi,                                 David Barcons,                                 Aday J. Molina-Mendoza,         
         and et al.        2018. "Thickness-Dependent Differential Reflectance Spectra of Monolayer and Few-Layer MoS2, MoSe2, WS2 and WSe2" Nanomaterials 8, no. 9: 725.
        https://doi.org/10.3390/nano8090725
    
    APA Style
    
                                Niu, Y.,                                 Gonzalez-Abad, S.,                                 Frisenda, R.,                                 Marauhn, P.,                                 Drüppel, M.,                                 Gant, P.,                                 Schmidt, R.,                                 Taghavi, N. S.,                                 Barcons, D.,                                 Molina-Mendoza, A. J.,                                 De Vasconcellos, S. M.,                                 Bratschitsch, R.,                                 Perez De Lara, D.,                                 Rohlfing, M.,                                 & Castellanos-Gomez, A.        
        
        (2018). Thickness-Dependent Differential Reflectance Spectra of Monolayer and Few-Layer MoS2, MoSe2, WS2 and WSe2. Nanomaterials, 8(9), 725.
        https://doi.org/10.3390/nano8090725