Meng, Q.; Wang, Y.; Liang, X.; Wang, Y.; Lu, Y.; Ju, D.; Zhang, Y.; Lin, Q.
A Weak-Magnetic-Field Measurement System with Large-Scale Uniformity and a Low Limit of Detection. Nanomaterials 2026, 16, 719.
https://doi.org/10.3390/nano16120719
AMA Style
Meng Q, Wang Y, Liang X, Wang Y, Lu Y, Ju D, Zhang Y, Lin Q.
A Weak-Magnetic-Field Measurement System with Large-Scale Uniformity and a Low Limit of Detection. Nanomaterials. 2026; 16(12):719.
https://doi.org/10.3390/nano16120719
Chicago/Turabian Style
Meng, Qingzhi, Yongshuai Wang, Xianfeng Liang, Yixue Wang, Yang Lu, Dengfeng Ju, Yuan Zhang, and Qijing Lin.
2026. "A Weak-Magnetic-Field Measurement System with Large-Scale Uniformity and a Low Limit of Detection" Nanomaterials 16, no. 12: 719.
https://doi.org/10.3390/nano16120719
APA Style
Meng, Q., Wang, Y., Liang, X., Wang, Y., Lu, Y., Ju, D., Zhang, Y., & Lin, Q.
(2026). A Weak-Magnetic-Field Measurement System with Large-Scale Uniformity and a Low Limit of Detection. Nanomaterials, 16(12), 719.
https://doi.org/10.3390/nano16120719
