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Journal: Nanomaterials, 2025
Volume: 15
Number: 821
821
Article: Deep Learning-Assisted Microscopic Polarization Inspection of Micro-Nano Damage Precursors: Automatic, Non-Destructive Metrology for Additive Manufacturing Devices
Authors: by Dingkang Li, Xing Peng, Zhenfeng Ye, Hongbing Cao, Bo Wang, Xinjie Zhao and Feng Shi
Link: https://www.mdpi.com/2079-4991/15/11/821

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