Çiçek, A.; Knabl, F.; Schiester, M.; Waldl, H.; Rafailović, L.D.; Tkadletz, M.; Mitterer, C.
Reliable Atom Probe Tomography of Cu Nanoparticles Through Tailored Encapsulation by an Electrodeposited Film. Nanomaterials 2025, 15, 43.
https://doi.org/10.3390/nano15010043
AMA Style
Çiçek A, Knabl F, Schiester M, Waldl H, Rafailović LD, Tkadletz M, Mitterer C.
Reliable Atom Probe Tomography of Cu Nanoparticles Through Tailored Encapsulation by an Electrodeposited Film. Nanomaterials. 2025; 15(1):43.
https://doi.org/10.3390/nano15010043
Chicago/Turabian Style
Çiçek, Aydan, Florian Knabl, Maximilian Schiester, Helene Waldl, Lidija D. Rafailović, Michael Tkadletz, and Christian Mitterer.
2025. "Reliable Atom Probe Tomography of Cu Nanoparticles Through Tailored Encapsulation by an Electrodeposited Film" Nanomaterials 15, no. 1: 43.
https://doi.org/10.3390/nano15010043
APA Style
Çiçek, A., Knabl, F., Schiester, M., Waldl, H., Rafailović, L. D., Tkadletz, M., & Mitterer, C.
(2025). Reliable Atom Probe Tomography of Cu Nanoparticles Through Tailored Encapsulation by an Electrodeposited Film. Nanomaterials, 15(1), 43.
https://doi.org/10.3390/nano15010043
