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Journal: Nanomaterials, 2023
Volume: 13
Number: 85
Article:
Tracing the Si Dangling Bond Nanopathway Evolution ina-SiNx:H Resistive Switching Memory by the Transient Current
Authors:
by
Tong Chen, Kangmin Leng, Zhongyuan Ma, Xiaofan Jiang, Kunji Chen, Wei Li, Jun Xu and Ling Xu
Link:
https://www.mdpi.com/2079-4991/13/1/85
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