Pham, H.-L.; Alcaire, T.; Soulan, S.; Le Cunff, D.; Tortai, J.-H.
Efficient Rigorous Coupled-Wave Analysis Simulation of Mueller Matrix Ellipsometry of Three-Dimensional Multilayer Nanostructures. Nanomaterials 2022, 12, 3951.
https://doi.org/10.3390/nano12223951
AMA Style
Pham H-L, Alcaire T, Soulan S, Le Cunff D, Tortai J-H.
Efficient Rigorous Coupled-Wave Analysis Simulation of Mueller Matrix Ellipsometry of Three-Dimensional Multilayer Nanostructures. Nanomaterials. 2022; 12(22):3951.
https://doi.org/10.3390/nano12223951
Chicago/Turabian Style
Pham, Hoang-Lam, Thomas Alcaire, Sebastien Soulan, Delphine Le Cunff, and Jean-Hervé Tortai.
2022. "Efficient Rigorous Coupled-Wave Analysis Simulation of Mueller Matrix Ellipsometry of Three-Dimensional Multilayer Nanostructures" Nanomaterials 12, no. 22: 3951.
https://doi.org/10.3390/nano12223951
APA Style
Pham, H.-L., Alcaire, T., Soulan, S., Le Cunff, D., & Tortai, J.-H.
(2022). Efficient Rigorous Coupled-Wave Analysis Simulation of Mueller Matrix Ellipsometry of Three-Dimensional Multilayer Nanostructures. Nanomaterials, 12(22), 3951.
https://doi.org/10.3390/nano12223951