Nguyen, H.-T.; Nguyen, Y.; Su, Y.-H.; Hsieh, Y.-P.; Hofmann, M.
Edge-Trimmed Nanogaps in 2D Materials for Robust, Scalable, and Tunable Lateral Tunnel Junctions. Nanomaterials 2021, 11, 981.
https://doi.org/10.3390/nano11040981
AMA Style
Nguyen H-T, Nguyen Y, Su Y-H, Hsieh Y-P, Hofmann M.
Edge-Trimmed Nanogaps in 2D Materials for Robust, Scalable, and Tunable Lateral Tunnel Junctions. Nanomaterials. 2021; 11(4):981.
https://doi.org/10.3390/nano11040981
Chicago/Turabian Style
Nguyen, Hai-Thai, Yen Nguyen, Yen-Hsun Su, Ya-Ping Hsieh, and Mario Hofmann.
2021. "Edge-Trimmed Nanogaps in 2D Materials for Robust, Scalable, and Tunable Lateral Tunnel Junctions" Nanomaterials 11, no. 4: 981.
https://doi.org/10.3390/nano11040981
APA Style
Nguyen, H.-T., Nguyen, Y., Su, Y.-H., Hsieh, Y.-P., & Hofmann, M.
(2021). Edge-Trimmed Nanogaps in 2D Materials for Robust, Scalable, and Tunable Lateral Tunnel Junctions. Nanomaterials, 11(4), 981.
https://doi.org/10.3390/nano11040981