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Journal: Nanomaterials, 2021
Volume: 11
Number: 494
Article:
Interface Trap-Induced Temperature Dependent Hysteresis and Mobility in β-Ga2O3 Field-Effect Transistors
Authors:
by
Youngseo Park, Jiyeon Ma, Geonwook Yoo and Junseok Heo
Link:
https://www.mdpi.com/2079-4991/11/2/494
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