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Aguilar-Merino P, Álvarez-Pérez G, Taboada-Gutiérrez J, Duan J, Prieto I, Álvarez-Prado LM, Nikitin AY, Martín-Sánchez J, Alonso-González P. Extracting the Infrared Permittivity of SiO₂ Substrates Locally by Near-Field Imaging of Phonon Polaritons in a van der Waals Crystal. Nanomaterials. 2021; 11(1):120. https://doi.org/10.3390/nano11010120

Aguilar-Merino, Patricia, Gonzalo Álvarez-Pérez, Javier Taboada-Gutiérrez, Jiahua Duan, Iván Prieto, Luis Manuel Álvarez-Prado, Alexey Y. Nikitin, Javier Martín-Sánchez, and Pablo Alonso-González. 2021. "Extracting the Infrared Permittivity of SiO₂ Substrates Locally by Near-Field Imaging of Phonon Polaritons in a van der Waals Crystal" Nanomaterials 11, no. 1: 120. https://doi.org/10.3390/nano11010120

Aguilar-Merino, P., Álvarez-Pérez, G., Taboada-Gutiérrez, J., Duan, J., Prieto, I., Álvarez-Prado, L. M., Nikitin, A. Y., Martín-Sánchez, J., & Alonso-González, P. (2021). Extracting the Infrared Permittivity of SiO₂ Substrates Locally by Near-Field Imaging of Phonon Polaritons in a van der Waals Crystal. Nanomaterials, 11(1), 120. https://doi.org/10.3390/nano11010120