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Journal: Nanomaterials, 2020
Volume: 10
Number: 1332
1332
Article: Effects of 5 MeV Proton Irradiation on Nitrided SiO₂/4H-SiC MOS Capacitors and the Related Mechanisms
Authors: by Dongxun Li, Yuming Zhang, Xiaoyan Tang, Yanjing He, Hao Yuan, Yifan Jia, Qingwen Song, Ming Zhang and Yimen Zhang
Link: https://www.mdpi.com/2079-4991/10/7/1332

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