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Journal: Nanomaterials, 2020
Volume: 10
Number: 853
853
Article: Nano-Scale Residual Stress Profiling in Thin Multilayer Films with Non-Equibiaxial Stress State
Authors: by Marco Sebastiani, Edoardo Rossi, Muhammad Zeeshan Mughal, Alessandro Benedetto, Paul Jacquet, Enrico Salvati and Alexander M. Korsunsky
Link: https://www.mdpi.com/2079-4991/10/5/853

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