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Open AccessArticle

Ablation in Externally Applied Electric and Magnetic Fields

1
Center for Micro-Photonics, Swinburne University of Technology, John Street, Hawthorn, VIC 3122, Australia
2
ARC Training Centre in Surface Engineering for Advanced Materials (SEAM), School of Science, Swinburne University of Technology, John Street, Hawthorn, VIC 3122, Australia
3
Australian Synchrotron, 800 Blackburn Road, Clayton, VIC 3168, Australia
4
Galatea Lab, IMT, STI, Ecole Polytechnique Fédérale de Lausanne (EPFL), Rue de la Maladière 71b, CH-2002 Neuchâtel, Switzerland
5
Tokyo Tech World Research Hub Initiative (WRHI), School of Materials and Chemical Technology, Tokyo Institute of Technology, 2-12-1, Ookayama, Meguro-ku, Tokyo 152-8550, Japan
*
Authors to whom correspondence should be addressed.
Nanomaterials 2020, 10(2), 182; https://doi.org/10.3390/nano10020182
Received: 29 December 2019 / Revised: 17 January 2020 / Accepted: 18 January 2020 / Published: 21 January 2020
(This article belongs to the Special Issue Laser Printing of Nanophotonic Structures)
To harness light-matter interactions at the nano-/micro-scale, better tools for control must be developed. Here, it is shown that by applying an external electric and/or magnetic field, ablation of Si and glass under ultra-short (sub-1 ps) laser pulse irradiation can be controlled via the Lorentz force F = e E + e [ v × B ] , where v is velocity of charge e, E is the applied electrical bias and B is the magnetic flux density. The external electric E-field was applied during laser ablation using suspended micro-electrodes above a glass substrate with an air gap for the incident laser beam. The counter-facing Al-electrodes on Si surface were used to study debris formation patterns on Si. Debris was deposited preferentially towards the negative electrode in the case of glass and Si ablation. Also, an external magnetic field was applied during laser ablation of Si in different geometries and is shown to affect ripple formation. Chemical analysis of ablated areas with and without a magnetic field showed strong chemical differences, revealed by synchrotron near-edge X-ray absorption fine structure (NEXAFS) measurements. Harnessing the vectorial nature of the Lorentz force widens application potential of surface modifications and debris formation in external E-/B-fields, with potential applications in mass and charge spectroscopes. View Full-Text
Keywords: ablation; electric field; magnetic field; debris; femtosecond laser fabrication; silicon; near-edge X-ray absorption fine structure (NEXAFS) ablation; electric field; magnetic field; debris; femtosecond laser fabrication; silicon; near-edge X-ray absorption fine structure (NEXAFS)
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MDPI and ACS Style

Maksimovic, J.; Ng, S.-H.; Katkus, T.; An Le, N.H.; Chon, J.W.; Cowie, B.C.; Yang, T.; Bellouard, Y.; Juodkazis, S. Ablation in Externally Applied Electric and Magnetic Fields. Nanomaterials 2020, 10, 182.

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