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Field Emission Air-Channel Devices as a Voltage Adder

Department of Electrical Engineering, National University of Kaohsiung, Kaohsiung 811, Taiwan
Author to whom correspondence should be addressed.
Nanomaterials 2020, 10(12), 2378;
Received: 29 September 2020 / Revised: 26 November 2020 / Accepted: 26 November 2020 / Published: 29 November 2020
(This article belongs to the Special Issue Nano Devices and Nano Sensors)
Field emission air-channel (FEAC) devices can work under atmospheric pressure with a low operation voltage when the electron channel is far less than the mean free path (MFP) in the air, thereby making them a practical component in circuits. Forward and reverse electron emissions of the current FEAC devices demonstrated symmetric Fowler–Nordheim (F–N) plots owing to the symmetric cathode and anode electrodes. This research aimed to demonstrate the arithmetic application of the FEAC devices, their substrate effect, and reliability. A voltage adder was composed of two FEAC devices whose two inputs were connected to two separate function generators, and one output was wire-connected to an oscilloscope. The devices were on a thin dielectric film and low-resistivity silicon substrate to evaluate the parasitic components and substrate effect, resulting in frequency-dependent impedance. The results show that the FEAC devices possessed arithmetic function, but the output voltage decreased. The FEAC devices were still capable of serving as a voltage adder after the reliability test, but electric current leakage increased. Finite element analysis indicated that the highest electrical fields and electron trajectories occur at the apices where the electrons travel with the shortest route less than the MFP in the air, thereby meeting the FEAC devices’ design. The modeling also showed that a sharp apex would generate a high electric field at the tip-gap-tip, enhancing the tunneling current. View Full-Text
Keywords: field emission electronic; air-channel; voltage adder; finite element analysis; Fowler–Nordheim tunneling; stress test field emission electronic; air-channel; voltage adder; finite element analysis; Fowler–Nordheim tunneling; stress test
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MDPI and ACS Style

Chang, W.-T.; Cheng, M.-C.; Chuang, T.-Y.; Tsai, M.-Y. Field Emission Air-Channel Devices as a Voltage Adder. Nanomaterials 2020, 10, 2378.

AMA Style

Chang W-T, Cheng M-C, Chuang T-Y, Tsai M-Y. Field Emission Air-Channel Devices as a Voltage Adder. Nanomaterials. 2020; 10(12):2378.

Chicago/Turabian Style

Chang, Wen-Teng, Ming-Chih Cheng, Tsung-Ying Chuang, and Ming-Yen Tsai. 2020. "Field Emission Air-Channel Devices as a Voltage Adder" Nanomaterials 10, no. 12: 2378.

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