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Open AccessArticle

Convenient Real-Time Monitoring of the Contamination of Surface Ion Trap

by Xinfang Zhang 1,2,†, Yizhu Hou 1,2,†, Ting Chen 1,2, Wei Wu 1,2,* and Pingxing Chen 1,2,*
1
Department of Physics, College of Liberal Arts and Sciences, National University of Defense Technology, Changsha 410073, China
2
Interdisciplinary Center for Quantum Information, National University of Defense Technology, Changsha 410073, China
*
Authors to whom correspondence should be addressed.
These authors contributed equally to this work.
Nanomaterials 2020, 10(1), 109; https://doi.org/10.3390/nano10010109
Received: 13 November 2019 / Revised: 17 December 2019 / Accepted: 28 December 2019 / Published: 6 January 2020
Recent studies indicated that contamination by adatoms on the surface ion trap can generate contact potential, leading to fluctuations in patch potential. By investigating contamination induced by surface adatoms during a loading process, a direct physical image of the contamination process and the relationship between the capacitance change and the contamination from surface adatoms is examined theoretically and experimentally. From the relationship, the contamination by surface adatoms and the effect of in situ treatment process can be monitored by the capacitance between electrodes in real time. This study is foundational to further research on anomalous heating with practical applications in quantum information processing from surface ion traps. View Full-Text
Keywords: adatoms contamination; thin film; surface ion trap; anomalous heating of ions; quantum information processing adatoms contamination; thin film; surface ion trap; anomalous heating of ions; quantum information processing
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Zhang, X.; Hou, Y.; Chen, T.; Wu, W.; Chen, P. Convenient Real-Time Monitoring of the Contamination of Surface Ion Trap. Nanomaterials 2020, 10, 109.

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