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Journal: Appl. Sci., 2019
Volume: 9
Number: 4241

Article: Labeling Confidence Values for Wafer-Handling Robot Arm Performance Using a Feature-Based General Regression Neural Network and Genetic Algorithm
Authors: by Yi-Cheng Huang, Zi-Sheng Yang and Hsien-Shu Liao
Link: https://www.mdpi.com/2076-3417/9/20/4241

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