Lohner, T.; Kalas, B.; Petrik, P.; Zolnai, Z.; Serényi, M.; Sáfrán, G.
Refractive Index Variation of Magnetron-Sputtered a-Si1−xGex by “One-Sample Concept” Combinatory. Appl. Sci. 2018, 8, 826.
https://doi.org/10.3390/app8050826
AMA Style
Lohner T, Kalas B, Petrik P, Zolnai Z, Serényi M, Sáfrán G.
Refractive Index Variation of Magnetron-Sputtered a-Si1−xGex by “One-Sample Concept” Combinatory. Applied Sciences. 2018; 8(5):826.
https://doi.org/10.3390/app8050826
Chicago/Turabian Style
Lohner, Tivadar, Benjamin Kalas, Peter Petrik, Zsolt Zolnai, Miklós Serényi, and György Sáfrán.
2018. "Refractive Index Variation of Magnetron-Sputtered a-Si1−xGex by “One-Sample Concept” Combinatory" Applied Sciences 8, no. 5: 826.
https://doi.org/10.3390/app8050826
APA Style
Lohner, T., Kalas, B., Petrik, P., Zolnai, Z., Serényi, M., & Sáfrán, G.
(2018). Refractive Index Variation of Magnetron-Sputtered a-Si1−xGex by “One-Sample Concept” Combinatory. Applied Sciences, 8(5), 826.
https://doi.org/10.3390/app8050826