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Molecular Dynamics of XFEL-Induced Photo-Dissociation, Revealed by Ion-Ion Coincidence Measurements

1
Department of Physics and Astronomy, University of Turku, FI-20014 Turku, Finland
2
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, Japan
3
Department of Physics, Graduate School of Science, Kyoto University, Kyoto 606-8502, Japan
4
RIKEN Spring-8 Center, Sayo, Hyogo 679-5148, Japan
*
Author to whom correspondence should be addressed.
Appl. Sci. 2017, 7(5), 531; https://doi.org/10.3390/app7050531
Received: 24 March 2017 / Revised: 25 April 2017 / Accepted: 12 May 2017 / Published: 19 May 2017
(This article belongs to the Special Issue X-Ray Free-Electron Laser)
X-ray free electron lasers (XFELs) providing ultrashort intense pulses of X-rays have proven to be excellent tools to investigate the dynamics of radiation-induced dissociation and charge redistribution in molecules and nanoparticles. Coincidence techniques, in particular multi-ion time-of-flight (TOF) coincident experiments, can provide detailed information on the photoabsorption, charge generation, and Coulomb explosion events. Here we review several such recent experiments performed at the SPring-8 Angstrom Compact free electron LAser (SACLA) facility in Japan, with iodomethane, diiodomethane, and 5-iodouracil as targets. We demonstrate how to utilize the momentum-resolving capabilities of the ion TOF spectrometers to resolve and filter the coincidence data and extract various information essential in understanding the time evolution of the processes induced by the XFEL pulses. View Full-Text
Keywords: free electron laser; Coulomb explosion; radiation damage; molecular dynamics; X-ray absorption; ultrafast dissociation; coincidence; photoion-photoion coincidence (PIPICO); ion mass spectroscopy; time-of-flight free electron laser; Coulomb explosion; radiation damage; molecular dynamics; X-ray absorption; ultrafast dissociation; coincidence; photoion-photoion coincidence (PIPICO); ion mass spectroscopy; time-of-flight
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MDPI and ACS Style

Kukk, E.; Motomura, K.; Fukuzawa, H.; Nagaya, K.; Ueda, K. Molecular Dynamics of XFEL-Induced Photo-Dissociation, Revealed by Ion-Ion Coincidence Measurements. Appl. Sci. 2017, 7, 531.

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