Kukk, E.; Motomura, K.; Fukuzawa, H.; Nagaya, K.; Ueda, K.
Molecular Dynamics of XFEL-Induced Photo-Dissociation, Revealed by Ion-Ion Coincidence Measurements. Appl. Sci. 2017, 7, 531.
https://doi.org/10.3390/app7050531
AMA Style
Kukk E, Motomura K, Fukuzawa H, Nagaya K, Ueda K.
Molecular Dynamics of XFEL-Induced Photo-Dissociation, Revealed by Ion-Ion Coincidence Measurements. Applied Sciences. 2017; 7(5):531.
https://doi.org/10.3390/app7050531
Chicago/Turabian Style
Kukk, Edwin, Koji Motomura, Hironobu Fukuzawa, Kiyonobu Nagaya, and Kiyoshi Ueda.
2017. "Molecular Dynamics of XFEL-Induced Photo-Dissociation, Revealed by Ion-Ion Coincidence Measurements" Applied Sciences 7, no. 5: 531.
https://doi.org/10.3390/app7050531
APA Style
Kukk, E., Motomura, K., Fukuzawa, H., Nagaya, K., & Ueda, K.
(2017). Molecular Dynamics of XFEL-Induced Photo-Dissociation, Revealed by Ion-Ion Coincidence Measurements. Applied Sciences, 7(5), 531.
https://doi.org/10.3390/app7050531