Miao, J.; Raytchev, B.; Nakashima, T.; Hiraoka, T.; Shimizu, K.; Gu, Y.; Higaki, T.
Reference-Free Evaluation Metric for Fine-Grained 3D Shape Editing. Appl. Sci. 2025, 15, 13023.
https://doi.org/10.3390/app152413023
AMA Style
Miao J, Raytchev B, Nakashima T, Hiraoka T, Shimizu K, Gu Y, Higaki T.
Reference-Free Evaluation Metric for Fine-Grained 3D Shape Editing. Applied Sciences. 2025; 15(24):13023.
https://doi.org/10.3390/app152413023
Chicago/Turabian Style
Miao, JiangDong, Bisser Raytchev, Takuji Nakashima, Takenori Hiraoka, Keigo Shimizu, Yanlei Gu, and Toru Higaki.
2025. "Reference-Free Evaluation Metric for Fine-Grained 3D Shape Editing" Applied Sciences 15, no. 24: 13023.
https://doi.org/10.3390/app152413023
APA Style
Miao, J., Raytchev, B., Nakashima, T., Hiraoka, T., Shimizu, K., Gu, Y., & Higaki, T.
(2025). Reference-Free Evaluation Metric for Fine-Grained 3D Shape Editing. Applied Sciences, 15(24), 13023.
https://doi.org/10.3390/app152413023