Seniushin, I.; Glazyrina, N.; Atanbayev, Y.; Bairamov, K.; Satiyeva, Y.; Nurman, O.; Altaibek, M.
A Framework-Driven Evaluation and Survey of MCU Fault Injection Resilience for IoT. Appl. Sci. 2025, 15, 11991.
https://doi.org/10.3390/app152211991
AMA Style
Seniushin I, Glazyrina N, Atanbayev Y, Bairamov K, Satiyeva Y, Nurman O, Altaibek M.
A Framework-Driven Evaluation and Survey of MCU Fault Injection Resilience for IoT. Applied Sciences. 2025; 15(22):11991.
https://doi.org/10.3390/app152211991
Chicago/Turabian Style
Seniushin, Igor, Natalya Glazyrina, Yernat Atanbayev, Kamal Bairamov, Yenlik Satiyeva, Olzhas Nurman, and Mamyr Altaibek.
2025. "A Framework-Driven Evaluation and Survey of MCU Fault Injection Resilience for IoT" Applied Sciences 15, no. 22: 11991.
https://doi.org/10.3390/app152211991
APA Style
Seniushin, I., Glazyrina, N., Atanbayev, Y., Bairamov, K., Satiyeva, Y., Nurman, O., & Altaibek, M.
(2025). A Framework-Driven Evaluation and Survey of MCU Fault Injection Resilience for IoT. Applied Sciences, 15(22), 11991.
https://doi.org/10.3390/app152211991
