Jun, E.S.;                     Sim, H.J.;                     Moon, S.J.    
        Advancing YOLOv8-Based Wafer Notch-Angle Detection Using Oriented Bounding Boxes, Hyperparameter Tuning, Architecture Refinement, and Transfer Learning. Appl. Sci. 2025, 15, 11507.
    https://doi.org/10.3390/app152111507
    AMA Style
    
                                Jun ES,                                 Sim HJ,                                 Moon SJ.        
                Advancing YOLOv8-Based Wafer Notch-Angle Detection Using Oriented Bounding Boxes, Hyperparameter Tuning, Architecture Refinement, and Transfer Learning. Applied Sciences. 2025; 15(21):11507.
        https://doi.org/10.3390/app152111507
    
    Chicago/Turabian Style
    
                                Jun, Eun Seok,                                 Hyo Jun Sim,                                 and Seung Jae Moon.        
                2025. "Advancing YOLOv8-Based Wafer Notch-Angle Detection Using Oriented Bounding Boxes, Hyperparameter Tuning, Architecture Refinement, and Transfer Learning" Applied Sciences 15, no. 21: 11507.
        https://doi.org/10.3390/app152111507
    
    APA Style
    
                                Jun, E. S.,                                 Sim, H. J.,                                 & Moon, S. J.        
        
        (2025). Advancing YOLOv8-Based Wafer Notch-Angle Detection Using Oriented Bounding Boxes, Hyperparameter Tuning, Architecture Refinement, and Transfer Learning. Applied Sciences, 15(21), 11507.
        https://doi.org/10.3390/app152111507