Jun, E.S.; Sim, H.J.; Moon, S.J.
Advancing YOLOv8-Based Wafer Notch-Angle Detection Using Oriented Bounding Boxes, Hyperparameter Tuning, Architecture Refinement, and Transfer Learning. Appl. Sci. 2025, 15, 11507.
https://doi.org/10.3390/app152111507
AMA Style
Jun ES, Sim HJ, Moon SJ.
Advancing YOLOv8-Based Wafer Notch-Angle Detection Using Oriented Bounding Boxes, Hyperparameter Tuning, Architecture Refinement, and Transfer Learning. Applied Sciences. 2025; 15(21):11507.
https://doi.org/10.3390/app152111507
Chicago/Turabian Style
Jun, Eun Seok, Hyo Jun Sim, and Seung Jae Moon.
2025. "Advancing YOLOv8-Based Wafer Notch-Angle Detection Using Oriented Bounding Boxes, Hyperparameter Tuning, Architecture Refinement, and Transfer Learning" Applied Sciences 15, no. 21: 11507.
https://doi.org/10.3390/app152111507
APA Style
Jun, E. S., Sim, H. J., & Moon, S. J.
(2025). Advancing YOLOv8-Based Wafer Notch-Angle Detection Using Oriented Bounding Boxes, Hyperparameter Tuning, Architecture Refinement, and Transfer Learning. Applied Sciences, 15(21), 11507.
https://doi.org/10.3390/app152111507