Order Article Reprints

Vu TTH, Vo TH, Nguyen TN, Choi J, Tran LH, Doan VHM, Nguyen VB, Lee W, Mondal S, Oh J. GAN-Based Super-Resolution in Linear R-SAM Imaging for Enhanced Non-Destructive Semiconductor Measurement. Applied Sciences. 2025; 15(12):6780. https://doi.org/10.3390/app15126780

Vu, Thi Thu Ha, Tan Hung Vo, Trong Nhan Nguyen, Jaeyeop Choi, Le Hai Tran, Vu Hoang Minh Doan, Van Bang Nguyen, Wonjo Lee, Sudip Mondal, and Junghwan Oh. 2025. "GAN-Based Super-Resolution in Linear R-SAM Imaging for Enhanced Non-Destructive Semiconductor Measurement" Applied Sciences 15, no. 12: 6780. https://doi.org/10.3390/app15126780

Vu, T. T. H., Vo, T. H., Nguyen, T. N., Choi, J., Tran, L. H., Doan, V. H. M., Nguyen, V. B., Lee, W., Mondal, S., & Oh, J. (2025). GAN-Based Super-Resolution in Linear R-SAM Imaging for Enhanced Non-Destructive Semiconductor Measurement. Applied Sciences, 15(12), 6780. https://doi.org/10.3390/app15126780