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Journal: Appl. Sci., 2023
Volume: 13
Number: 10429

Article: Polarization Sensitivity in Scattering-Type Scanning Near-Field Optical Microscopy—Towards Nanoellipsometry
Authors: by Felix G. Kaps, Susanne C. Kehr and Lukas M. Eng
Link: https://www.mdpi.com/2076-3417/13/18/10429

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