Blanco, D.; Fernández, P.; Fernández, A.; Alvarez, B.J.; Rico, J.C.
The Influence of Image Processing and Layer-to-Background Contrast on the Reliability of Flatbed Scanner-Based Characterisation of Additively Manufactured Layer Contours. Appl. Sci. 2021, 11, 178.
https://doi.org/10.3390/app11010178
AMA Style
Blanco D, Fernández P, Fernández A, Alvarez BJ, Rico JC.
The Influence of Image Processing and Layer-to-Background Contrast on the Reliability of Flatbed Scanner-Based Characterisation of Additively Manufactured Layer Contours. Applied Sciences. 2021; 11(1):178.
https://doi.org/10.3390/app11010178
Chicago/Turabian Style
Blanco, David, Pedro Fernández, Alejandro Fernández, Braulio J. Alvarez, and José Carlos Rico.
2021. "The Influence of Image Processing and Layer-to-Background Contrast on the Reliability of Flatbed Scanner-Based Characterisation of Additively Manufactured Layer Contours" Applied Sciences 11, no. 1: 178.
https://doi.org/10.3390/app11010178
APA Style
Blanco, D., Fernández, P., Fernández, A., Alvarez, B. J., & Rico, J. C.
(2021). The Influence of Image Processing and Layer-to-Background Contrast on the Reliability of Flatbed Scanner-Based Characterisation of Additively Manufactured Layer Contours. Applied Sciences, 11(1), 178.
https://doi.org/10.3390/app11010178