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Parallel Broadband Femtosecond Reflection Spectroscopy at a Soft X-Ray Free-Electron Laser
 
 

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Journal: Appl. Sci., 2020
Volume: 10
Number: 7210

Article: Flat Field Soft X-ray Spectrometry with Reflection Zone Plates on a Curved Substrate
Authors: by Jürgen Probst, Christoph Braig and Alexei Erko
Link: https://www.mdpi.com/2076-3417/10/20/7210

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