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Journal: Machines, 2024
Volume: 12
Number: 618
Article:
Improved Bayes-Based Reliability Prediction of Small-Sample Hall Current Sensors
Authors:
by
Ting Chen, Zhengyu Liu, Ling Ju, Yongling Lu and Shike Wei
Link:
https://www.mdpi.com/2075-1702/12/9/618
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