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Journal: Crystals, 2019
Volume: 9
Number: 631
631
Article: In Situ Synchrotron X-ray Diffraction Reciprocal Space Mapping Measurements in the RF-MBE Growth of GaInN on GaN and InN
Authors: by Tomohiro Yamaguchi, Takuo Sasaki, Seiji Fujikawa, Masamitu Takahasi, Tsutomu Araki, Takeyoshi Onuma, Tohru Honda and Yasushi Nanishi
Link: https://www.mdpi.com/2073-4352/9/12/631

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