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Crystals
Volume 15
Issue 7
10.3390/cryst15070604
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This is an early access version, the complete PDF, HTML, and XML versions will be available soon.
Article

The Performance Degradation of Red, Green, and Blue Micro-LEDs Under High-Temperature Electrical Stress

by
Changdong Tong
1,
Yu Liu
1,
Quan Deng
1,
Li Pan
2,
Guolong Chen
1,
Yijun Lu
1,
Tingzhu Wu
1,
Zhong Chen
1 and
Weijie Guo
1,*
1
National Innovation Platform for the Fusion of Industry and Education in Integrated Circuits, Department of Electronic Science, School of Electronic Science and Engineering, Xiamen University, Xiamen 361005, China
2
AKM Electronic Technology (Suzhou) Co., Ltd., Suzhou 215129, China
*
Author to whom correspondence should be addressed.
Crystals 2025, 15(7), 604; https://doi.org/10.3390/cryst15070604 (registering DOI)
Submission received: 3 June 2025 / Revised: 23 June 2025 / Accepted: 26 June 2025 / Published: 27 June 2025
(This article belongs to the Special Issue II-VI and III-V Semiconductors for Optoelectronic Devices)
Versions Notes

Abstract

In this work, the degradation in luminous characteristics of red, green, and blue (RGB) micro-LEDs (10 µm × 10 µm) under electrical stress at 360 K has been investigated. After 280 h of aging, the AlGaInP-based red micro-LEDs exhibit a 31.7% reduction in maximum external quantum efficiency, which is significantly greater than the reductions observed in InGaN-based green and blue micro-LEDs. Specifically, the peak wavelength redshift by 0.6 nm, and blueshift 1.0 nm, and 0.5 nm for RGB micro-LEDs, respectively. The color purity of green and blue micro-LEDs decreases by 3.6% and 0.7%, respectively, resulting in a 7% reduction in color gamut.
Keywords: micro-LED; electric and thermal stress; luminous degradation micro-LED; electric and thermal stress; luminous degradation

Share and Cite

MDPI and ACS Style

Tong, C.; Liu, Y.; Deng, Q.; Pan, L.; Chen, G.; Lu, Y.; Wu, T.; Chen, Z.; Guo, W. The Performance Degradation of Red, Green, and Blue Micro-LEDs Under High-Temperature Electrical Stress. Crystals 2025, 15, 604. https://doi.org/10.3390/cryst15070604

AMA Style

Tong C, Liu Y, Deng Q, Pan L, Chen G, Lu Y, Wu T, Chen Z, Guo W. The Performance Degradation of Red, Green, and Blue Micro-LEDs Under High-Temperature Electrical Stress. Crystals. 2025; 15(7):604. https://doi.org/10.3390/cryst15070604

Chicago/Turabian Style

Tong, Changdong, Yu Liu, Quan Deng, Li Pan, Guolong Chen, Yijun Lu, Tingzhu Wu, Zhong Chen, and Weijie Guo. 2025. "The Performance Degradation of Red, Green, and Blue Micro-LEDs Under High-Temperature Electrical Stress" Crystals 15, no. 7: 604. https://doi.org/10.3390/cryst15070604

APA Style

Tong, C., Liu, Y., Deng, Q., Pan, L., Chen, G., Lu, Y., Wu, T., Chen, Z., & Guo, W. (2025). The Performance Degradation of Red, Green, and Blue Micro-LEDs Under High-Temperature Electrical Stress. Crystals, 15(7), 604. https://doi.org/10.3390/cryst15070604

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