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Journal: Crystals, 2025
Volume: 15
Number: 143

Article: Spectroscopic Ellipsometry and Wave Optics: A Dual Approach to Characterizing TiN/AlN Composite Dielectrics
Authors: by Mohamed El Hachemi, Nikhar Khanna and Emanuele Barborini
Link: https://www.mdpi.com/2073-4352/15/2/143

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