Article Versions Notes

Yin Y, Xia J, Nie H, Yao B, Sun D, Ma L, Li R, Li Z, Zhang B. Numerical Simulation Analysis of Laser Ultrasonic Detection of Defects in Silicon Carbide. Crystals. 2025; 15(2):125. https://doi.org/10.3390/cryst15020125

Yin, Yuan, Jinbao Xia, Hongkun Nie, Bo Yao, Daofa Sun, Longnan Ma, Ruihang Li, Zihao Li, and Baitao Zhang. 2025. "Numerical Simulation Analysis of Laser Ultrasonic Detection of Defects in Silicon Carbide" Crystals 15, no. 2: 125. https://doi.org/10.3390/cryst15020125

Yin, Y., Xia, J., Nie, H., Yao, B., Sun, D., Ma, L., Li, R., Li, Z., & Zhang, B. (2025). Numerical Simulation Analysis of Laser Ultrasonic Detection of Defects in Silicon Carbide. Crystals, 15(2), 125. https://doi.org/10.3390/cryst15020125