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Journal: Micromachines, 2018
Volume: 9
Number: 643
643
Article: Variability Predictions for the Next Technology Generations of n-type Si_xGe_1−x Nanowire MOSFETs
Authors: by Jaehyun Lee, Oves Badami, Hamilton Carrillo-Nuñez, Salim Berrada, Cristina Medina-Bailon, Tapas Dutta, Fikru Adamu-Lema, Vihar P. Georgiev and Asen Asenov
Link: https://www.mdpi.com/2072-666X/9/12/643

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