Harkness, J.G.; Pan, D.; Ramollari, H.; Yuzvinsky, T.D.; Schmidt, H.; Hawkins, A.R.
Silicon Dioxide Multi-Mode Interference Spectrometers. Micromachines 2026, 17, 453.
https://doi.org/10.3390/mi17040453
AMA Style
Harkness JG, Pan D, Ramollari H, Yuzvinsky TD, Schmidt H, Hawkins AR.
Silicon Dioxide Multi-Mode Interference Spectrometers. Micromachines. 2026; 17(4):453.
https://doi.org/10.3390/mi17040453
Chicago/Turabian Style
Harkness, James G., Denghui Pan, Helio Ramollari, Thomas D. Yuzvinsky, Holger Schmidt, and Aaron R. Hawkins.
2026. "Silicon Dioxide Multi-Mode Interference Spectrometers" Micromachines 17, no. 4: 453.
https://doi.org/10.3390/mi17040453
APA Style
Harkness, J. G., Pan, D., Ramollari, H., Yuzvinsky, T. D., Schmidt, H., & Hawkins, A. R.
(2026). Silicon Dioxide Multi-Mode Interference Spectrometers. Micromachines, 17(4), 453.
https://doi.org/10.3390/mi17040453