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Journal: Micromachines, 2026
Volume: 17
Number: 452
452
Article: A Universal Deep Learning Model for Predicting Detection Performance and Single-Event Effects of SPAD Devices
Authors: by Yilei Chen, Jin Huang, Yuxiang Zeng, Yi Jiang, Shulong Wang, Shupeng Chen and Hongxia Liu
Link: https://www.mdpi.com/2072-666X/17/4/452

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