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Journal: Micromachines, 2026
Volume: 17
Number: 367

Article: MM-WAE: Multimodal Wasserstein Autoencoders for Semi-Supervised Wafer Map Defect Recognition
Authors: by Yifeng Zhang, Qingqing Sun, Ziyu Liu and David Wei Zhang
Link: https://www.mdpi.com/2072-666X/17/3/367

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