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Journal: Micromachines, 2026
Volume: 17
Number: 153

Article: An Analysis of Diffracted Mode Outcoupling in the Context of Optical Gain Measurements of Organic Thin Films: A Diffracted Emission Profile Method
Authors: by Thilo Pudleiner, Jan Hoinkis and Christian Karnutsch
Link: https://www.mdpi.com/2072-666X/17/2/153

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