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Journal: Micromachines, 2025
Volume: 16
Number: 583
583
Article: Deep Learning Method for Breakdown Voltage and Forward I-V Characteristic Prediction of Silicon Carbide Schottky Barrier Diodes
Authors: by Hao Zhou, Xiang Wang, Shulong Wang, Chenyu Liu, Dongliang Chen, Jiarui Li, Lan Ma and Guohao Zhang
Link: https://www.mdpi.com/2072-666X/16/5/583

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