Long, Y.; Aierken, A.; Liu, X.; Liu, M.; Gao, C.; Wang, G.; Wang, D.; Majumdar, S.; Xuan, Y.; Liu, M.;
et al. Heavy Ions Induced Single-Event Transient in SiGe-on-SOI HBT by TCAD Simulation. Micromachines 2025, 16, 532.
https://doi.org/10.3390/mi16050532
AMA Style
Long Y, Aierken A, Liu X, Liu M, Gao C, Wang G, Wang D, Majumdar S, Xuan Y, Liu M,
et al. Heavy Ions Induced Single-Event Transient in SiGe-on-SOI HBT by TCAD Simulation. Micromachines. 2025; 16(5):532.
https://doi.org/10.3390/mi16050532
Chicago/Turabian Style
Long, Yuedecai, Abuduwayiti Aierken, Xuefei Liu, Mingqiang Liu, Changsong Gao, Gang Wang, Degui Wang, Sandip Majumdar, Yundong Xuan, Mengxin Liu,
and et al. 2025. "Heavy Ions Induced Single-Event Transient in SiGe-on-SOI HBT by TCAD Simulation" Micromachines 16, no. 5: 532.
https://doi.org/10.3390/mi16050532
APA Style
Long, Y., Aierken, A., Liu, X., Liu, M., Gao, C., Wang, G., Wang, D., Majumdar, S., Xuan, Y., Liu, M., & Bi, J.
(2025). Heavy Ions Induced Single-Event Transient in SiGe-on-SOI HBT by TCAD Simulation. Micromachines, 16(5), 532.
https://doi.org/10.3390/mi16050532
