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Journal: Micromachines, 2025
Volume: 16
Number: 339
339
Article: Performance Degradation of Ga₂O₃-Based X-Ray Detector Under Gamma-Ray Irradiation
Authors: by Xiao Ouyang, Silong Zhang, Tao Bai, Zhuo Chen, Yuxin Deng, Leidang Zhou, Xiaojing Song, Hao Chen, Yuru Lai, Xing Lu, Liang Chen, Liangliang Miao and Xiaoping Ouyang
Link: https://www.mdpi.com/2072-666X/16/3/339

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