Tyaginov, S.; Bury, E.; Grill, A.; Kao, E.; Keersgieter, A.D.; Makarov, A.; Vandemaele, M.; Spessot, A.; Chasin, A.; Kaczer, B.
Incorporation of Temperature Impact on Hot-Carrier Degradation into Compact Physics Model. Micromachines 2025, 16, 1424.
https://doi.org/10.3390/mi16121424
AMA Style
Tyaginov S, Bury E, Grill A, Kao E, Keersgieter AD, Makarov A, Vandemaele M, Spessot A, Chasin A, Kaczer B.
Incorporation of Temperature Impact on Hot-Carrier Degradation into Compact Physics Model. Micromachines. 2025; 16(12):1424.
https://doi.org/10.3390/mi16121424
Chicago/Turabian Style
Tyaginov, Stanislav, Erik Bury, Alexander Grill, Ethan Kao, An De Keersgieter, Alexander Makarov, Michiel Vandemaele, Alessio Spessot, Adrian Chasin, and Ben Kaczer.
2025. "Incorporation of Temperature Impact on Hot-Carrier Degradation into Compact Physics Model" Micromachines 16, no. 12: 1424.
https://doi.org/10.3390/mi16121424
APA Style
Tyaginov, S., Bury, E., Grill, A., Kao, E., Keersgieter, A. D., Makarov, A., Vandemaele, M., Spessot, A., Chasin, A., & Kaczer, B.
(2025). Incorporation of Temperature Impact on Hot-Carrier Degradation into Compact Physics Model. Micromachines, 16(12), 1424.
https://doi.org/10.3390/mi16121424
