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Journal: Micromachines, 2023
Volume: 14
Number: 1606
Article:
Metal-Induced Trap States: The Roles of Interface and Border Traps in HfO2/InGaAs
Authors:
by
Huy-Binh Do, Quang-Ho Luc, Phuong V. Pham, Anh-Vu Phan-Gia, Thanh-Son Nguyen, Hoang-Minh Le and Maria Merlyne De Souza
Link:
https://www.mdpi.com/2072-666X/14/8/1606
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