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Journal: Micromachines, 2023
Volume: 14
Number: 2085
Article:
An Improved Model of Single-Event Transients Based on Effective Space Charge for Metal–Oxide–Semiconductor Field-Effect Transistor
Authors:
by
Yutao Zhang, Hongliang Lu, Chen Liu, Yuming Zhang, Ruxue Yao and Xingming Liu
Link:
https://www.mdpi.com/2072-666X/14/11/2085
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