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Journal: Micromachines, 2023
Volume: 14
Number: 2085

Article: An Improved Model of Single-Event Transients Based on Effective Space Charge for Metal–Oxide–Semiconductor Field-Effect Transistor
Authors: by Yutao Zhang, Hongliang Lu, Chen Liu, Yuming Zhang, Ruxue Yao and Xingming Liu
Link: https://www.mdpi.com/2072-666X/14/11/2085

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