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Micromachines2022, 13(6), 883;https://doi.org/10.3390/mi13060883

Journal: MicromachinesVolume: 13Number: 883

Article: Recent Progress in Physics-Based Modeling of Electromigration in Integrated Circuit Interconnects

Authors:
Wen-Sheng Zhao^1,*,
Rui Zhang² and
Da-Wei Wang¹

Link: https://www.mdpi.com/2072-666X/13/6/883

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