Order Article Reprints

Aguirre FL, Piros E, Kaiser N, Vogel T, Petzold S, Gehrunger J, Oster T, Hochberger C, Suñé J, Alff L, et al. Fast Fitting of the Dynamic Memdiode Model to the Conduction Characteristics of RRAM Devices Using Convolutional Neural Networks. Micromachines. 2022; 13(11):2002. https://doi.org/10.3390/mi13112002

Aguirre, Fernando Leonel, Eszter Piros, Nico Kaiser, Tobias Vogel, Stephan Petzold, Jonas Gehrunger, Timo Oster, Christian Hochberger, Jordi Suñé, Lambert Alff, and et al. 2022. "Fast Fitting of the Dynamic Memdiode Model to the Conduction Characteristics of RRAM Devices Using Convolutional Neural Networks" Micromachines 13, no. 11: 2002. https://doi.org/10.3390/mi13112002

Aguirre, F. L., Piros, E., Kaiser, N., Vogel, T., Petzold, S., Gehrunger, J., Oster, T., Hochberger, C., Suñé, J., Alff, L., & Miranda, E. (2022). Fast Fitting of the Dynamic Memdiode Model to the Conduction Characteristics of RRAM Devices Using Convolutional Neural Networks. Micromachines, 13(11), 2002. https://doi.org/10.3390/mi13112002