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Journal: Micromachines, 2021
Volume: 12
Number: 572

Article: Fabrication of All-GaN Integrated MIS-HEMTs with High Threshold Voltage Stability Using Supercritical Technology
Authors: by Meihua Liu, Yang Yang, Changkuan Chang, Lei Li and Yufeng Jin
Link: https://www.mdpi.com/2072-666X/12/5/572

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