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Journal: Micromachines, 2021
Volume: 12
Number: 1152

Article: Temperature Impacts on Endurance and Read Disturbs in Charge-Trap 3D NAND Flash Memories
Authors: by Fei Chen, Bo Chen, Hongzhe Lin, Yachen Kong, Xin Liu, Xuepeng Zhan and Jiezhi Chen
Link: https://www.mdpi.com/2072-666X/12/10/1152

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