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Open AccessArticle

Design and Characterization of an EEG-Hat for Reliable EEG Measurements

Department of Mechanical Engineering, Keio University, 3-14-1 Hiyoshi, Kohoku-ku, Yokohama, Kanagawa 223-8522, Japan
Author to whom correspondence should be addressed.
Micromachines 2020, 11(7), 635;
Received: 6 June 2020 / Revised: 24 June 2020 / Accepted: 25 June 2020 / Published: 28 June 2020
In this study, a new hat-type electroencephalogram (EEG) device with candle-like microneedle electrodes (CMEs), called an EEG-Hat, was designed and fabricated. CMEs are dry EEG electrodes that can measure high-quality EEG signals without skin treatment or conductive gels. One of the challenges in the measurement of high-quality EEG signals is the fixation of electrodes to the skin, i.e., the design of a good EEG headset. The CMEs were able to achieve good contact with the scalp for heads of different sizes and shapes, and the EEG-Hat has a shutter mechanism to separate the hair and ensure good contact between the CMEs and the scalp. Simultaneous measurement of EEG signals from five measurement points on the scalp was successfully conducted after a simple and brief setup process. The EEG-Hat is expected to contribute to the advancement of EEG research. View Full-Text
Keywords: electroencephalography; microneedle; dry electrode; headset electroencephalography; microneedle; dry electrode; headset
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Kawana, T.; Yoshida, Y.; Kudo, Y.; Iwatani, C.; Miki, N. Design and Characterization of an EEG-Hat for Reliable EEG Measurements. Micromachines 2020, 11, 635.

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