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Journal: Micromachines, 2020
Volume: 11
Number: 48
48
Article: Focused Electron Beam-Based 3D Nanoprinting for Scanning Probe Microscopy: A Review
Authors: by Harald Plank, Robert Winkler, Christian H. Schwalb, Johanna Hütner, Jason D. Fowlkes, Philip D. Rack, Ivo Utke and Michael Huth
Link: https://www.mdpi.com/2072-666X/11/1/48

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