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Journal: Micromachines, 2019
Volume: 10
Number: 485

Article: Investigation of 1200 V SiC MOSFETs’ Surge Reliability
Authors: by Huan Li, Jue Wang, Na Ren, Hongyi Xu and Kuang Sheng
Link: https://www.mdpi.com/2072-666X/10/7/485

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